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Clear bins#

A test that can be used to clear all bins of a probe station wafer map.

Description#

Sets bin codes of all dies and sub-sites to NullBin code at the probe station wafer map.

Input parameters#

The test requires to select a probe station, added in the device manager.

Output parameters#

The test does not provide output parameters.

Supported devices#

The following devices are supported by this test:

  • MPI SENTIO Software Suite
  • Velox Software Suite (FormFactor Inc.)

Example#

Hardware setup:

Connect a supported wafer prober to the computer running Measmatic over TCP/IP, GPIB or RS232. 

flowchart LR
    A(Measmatic) o---o |TCP/IP, 
    GPIB or 
    RS232| B(Wafer prober)

In the device manager add the wafer prober to the current test site configuration. Change the name, the IP address in the device properties of the device. If needed, increase the communication timeout for the probe station device.