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Chuck contact#

A test that can be used to move a chuck inside a probe station up to a set contact height.

Description#

The test is used to move a chuck inside a probe station up to a set contact height. This test requires an taught contact height at the probe station and the chuck to be placed in the probing area. If over-travel is enabled chuck moves to over-travel height. If contact height is not set the command is not carried out.

Input parameters#

The test requires to select a probe station, added in the device manager.

Output parameters#

The test does not provide output parameters.

Supported devices#

The following devices are supported by this test:

  • MPI SENTIO Software Suite
  • Accretech UF200
  • Velox Software Suite (FormFactor Inc.)

Example#

Hardware setup:

Connect a wafer prober to the computer running Measmatic over TCP/IP, GPIB or RS232. 

flowchart LR
    A(Measmatic) o---o |TCP/IP, 
    GPIB or 
    RS232| B(Wafer prober)

In the device manager add the wafer prober to the current test site configuration. Change the name, the IP address in the device properties of the device. If needed, increase the communication timeout for the probe station device.